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Home arrow Magazine Categories arrow Semiconductor International arrow Semiconductor International, August 2009

Semiconductor International, August 2009

Wednesday, 26 August 2009

Semiconductor International, August 2009, free digital magazinesSemiconductor International is the world's leading monthly magazine written for manufacturers of semiconductors and integrated circuits.

Semiconductor International is a technical/business publication covering the global semiconductor manufacturing industry. It serves the needs of semiconductor engineers and suppliers through a wide range of products and services including magazines, directories, trade show guides, newsletters, specialized supplements, original research, industry seminars and awards.

Founded over 25 years ago, Semiconductor International is the leading technical publication covering the global semiconductor industry. SI has the largest circulation of qualified buyers in semiconductor fabs and foundries, features the industry's largest and most experienced full-time technical editorial staff, and carries more pages of editorial and advertising than any other industry publication.

Semiconductor International is part of Reed Elsevier, the world's largest provider of business-to-business information, and home of the world's most extensive collection of specialized electronic industry publications.

Free Subscription to Semiconductor International

Geographic Eligibility: Selected International

Offered Free by: Reed Business Information

Read the Digital Issue: Semiconductor International, August 2009

FEATURES
Defect Detection Drives to Greater Depths
Equipment suppliers are scrambling to develop new methods to detect particles that are smaller, visible and non-visible, while maintaining throughput.
Ruth DeJule, Contributing Editor -- Semiconductor International

The impact of the industry's continued shrink to smaller geometries and the associated introduction of new materials and processes are hotly discussed. But unlike lithography, where new technologies have been in the press for more than a decade as the theoretical limits of optical has loomed, defect detection, the heart of yield management (Fig. 1), has not felt the same pressure, until recently. ...

Taking Measurement Technology to the Quantum Level

Imaging Bonded Wafer Defects for 3-D

Visit Semiconductor International Website

As the semiconductor manufacturing industrys most comprehensive website, www.semiconductor.net is your source for breaking news, in-depth technical articles, and web-exclusive content developed by SI editors and contributors.For quick access to targeted information, our site offers focused micro-sites on key technologies.

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